Industry leading high-speed memory test platform,
offering at-speed final test and scalable to 8Gbps,
a 10 year system lifetime via economical upgrades and
superior throughput for lowest cost of test.
The Advantest V93000 High-Speed Memory (HSM) Series is the fastest final test solution available today offering highly accurate at-speed I/O and at-speed memory core access testing of up to 8 Gbps and future-ready upgradeability to higher data rates and higher parallel test capabilities for unique lifetime value and return on investment
The HSM Series leverages the advanced test technology and extended architecture of the proven Advantest V93000 test platform to ensure high test quality and fast "yield learning" at the lowest cost of test in this memory category. Using the proven per-pin timing architecture of the V93000 platform, the HSM Series delivers the functionality to address the most demanding DRAM technologies, including DDR3, DDR4, XDR and GDDR, and provides the flexibility to address the requirements of future DRAM technologies to ensure your test investment is protected.
Proven in R&D and validation labs worldwide, the V93000 HSM is perfect for engineering and design verification with it’s scalable performance?up to 12.8 Gbps with HSM HX?plus compatibility with production systems.
V93000 HSM Platform
Industry leading high-speed memory final test, scalable to 8Gbps, with longest life, superior throughput and lowest cost of test.
The requirements of today’s high-speed memory – higher speeds, performance, production volume – means that test systems must offer greater functionality and parallelism while maintaining low cost of test. The scalable platform architecture of the Advantest V93000 HSM combines functionality, performance and flexibility into a single test system with unmatched overall test economics for outstanding return on investment.
Leveraging the proven per-pin timing architecture and technology components of the V93000 platform, the HSM series features significant architectural extensions addressing the unique requirements for final test of DRAMs, thus becoming a TRUE memory-ATE-per-pin architecture. With the majority of the functionality tightly integrated into the system’s test head, the platform offers superior performance, parallelism, unprecedented scalability and control.
The scalability of the V93000 HSM platform means it is future-ready, offering upgradeability to data rates beyond those of today – true investment protection for DDR3, DDR4 and future DRAM technologies.
Components and Options
| System Infrastructure | V93000 Infrastructure |
|---|---|
| Test-Head Options: |
|
| Memory Test Cards |
|
| High-Speed Extension Card | HSM HX |
| Device Power Supplies | DC Scale DPS32 and MS-DPS cards |
| System Controller | High Performance HP-LX Workstation |
| Software | HSM Memory Test Software Bundle |
| Testcell partner products | Custom Test Fixture Boards from TSE, Korea |
Integrated test-cell maximizes productivity
The V93000 HSM Series comes with an integrated volume manufacturing test-cell, which ensures reliable operation and high uptime as well as efficient one-person operation, comprising tester-to-handler docking, test fixture exchange and test fixture buffer storage within the test-cell for maximized productivity.
- Optimized tester-to-handler docking repeatability
- Flexible floor-plan layout options with small footprint
- Lowest handler index time and cycle time overhead for highest throughput efficiency
- Best temperature accuracy of ±1.5°C or better for best production yields
Engineering and Characterization
Characterization up to 12.8Gbps with best engineering tool-set
Proven in R&D and validation labs worldwide, the V93000 HSM Series provides the industry’s most advanced high-speed memory test capabilities in a cost-effective, small footprint tester, making it a perfect fit for engineering, design verification & characterization.
Due to the scalability of the V93000 HSM platform, the new generation V93000 HSM memory test cards, HSM6800, HSM4000 and HSM3G, are plug-and-play extensions and can be easily combined with already available memory test cards, such as HSM3600 and HSM HX. The ability to upgrade existing engineering test systems with latest generation high-speed technology provides flexible access to higher performance and enhanced high-speed test functionality at lowest capital spending.
- Best in industry high-speed performance scalable up to 12.8Gbps with the market proven HSM HX
- Easy to expand capabilities with new generation memory test cards retaining full compatibility
- Compact Test Head, fully compatible to HVM: same hardware, same software, same DUT boards, same ability to use future platform enhancements
- Easy test program transfer and correlation from engineering to production
- Unique Flexibility, addressing DDR3/4, GDDR5 and XDR within one system
- Best engineering tool-set: Jitter Injection & Measurement, Pattern controlled DC test, Bitmap, Timing Diagram, Real-time Source-Synchronous, Signal Equalization (and more)
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