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Shimadzu SolidSpec-3700/3700DUV are the top-of-the-line spectrophotometer with high sensitivity, deep UV measurement and a large sample compartment. The SolidSpec-3700/3700DUV respond to the following requirements in optical, semiconductor and FPD applications.
FPD:
High-sensitivity measurement in NIR and a large sample compartment for material evaluation
Semiconductors:
Deep UV measurement in accordance with shorter wavelength laser, and 12-inch wafer whole surface measurement
Optical communications:
High-sensitivity measurement of anti-reflection films in NIR
Optics:
High-sensitivity measurement from deep UV to NIR, and a large sample compartment
High-sensitivity measurement in NIR and a large sample compartment for material evaluation
Semiconductors:
Deep UV measurement in accordance with shorter wavelength laser, and 12-inch wafer whole surface measurement
Optical communications:
High-sensitivity measurement of anti-reflection films in NIR
Optics:
High-sensitivity measurement from deep UV to NIR, and a large sample compartment
SolidSpec-3700/3700DUV Features
High Sensitivity
The SolidSpec-3700 and 3700DUV are the FIRST UV-VIS-NIR SPECTROPHOTOMETERS with THREE DETECTORS: a photomultiplier tube (PMT) detector for the ultraviolet and visible region; InGaAs and PbS detectors for the near-infrared region. The use of the InGaAs and PbS detectors makes the sensitivity in the near-infrared region significantly high.
Deep UV Measurement
The SolidSpec-3700DUV has the capability to measure the deep ultaviolet region
dwon to 165nm(note) (or to 175nm with an itegrating sphere) by purging both
the optical and the sample compartment with nitrogen gas.
Note) 165nm is the minimum wavelength for SolidSpec-3700DUV with its optical attachment, Direct Detection Unit DDU-DUV.
Large Sample Compartment
The large sample compartment (900W x 700D x 350H mm) allows large samples to be measured without destroying the sample. The vertical optical path makes it possible to measure large samples while keeping them horizontal. The whole sample area of 12 inches or 310 x 310 mm samples is measurable by mounting the automatic X-Y stage (option).
Optional Accessories
Direct Detection Unit DDU/DDU-DUV (for liquid/solid transmission measurements)
Automatic X-Y Stage (for automated measurement)
Large Specular Reflectance Attachment
Nitrogen Gas Flow Meter
Absolute Specular Reflectance Attachments (5°12°30°45°)
Sample Base Plate Integrating Sphere Set
The SolidSpec-3700 and 3700DUV are the FIRST UV-VIS-NIR SPECTROPHOTOMETERS with THREE DETECTORS: a photomultiplier tube (PMT) detector for the ultraviolet and visible region; InGaAs and PbS detectors for the near-infrared region. The use of the InGaAs and PbS detectors makes the sensitivity in the near-infrared region significantly high.
Deep UV Measurement
The SolidSpec-3700DUV has the capability to measure the deep ultaviolet region
dwon to 165nm(note) (or to 175nm with an itegrating sphere) by purging both
the optical and the sample compartment with nitrogen gas.
Note) 165nm is the minimum wavelength for SolidSpec-3700DUV with its optical attachment, Direct Detection Unit DDU-DUV.
Large Sample Compartment
The large sample compartment (900W x 700D x 350H mm) allows large samples to be measured without destroying the sample. The vertical optical path makes it possible to measure large samples while keeping them horizontal. The whole sample area of 12 inches or 310 x 310 mm samples is measurable by mounting the automatic X-Y stage (option).
Optional Accessories
Direct Detection Unit DDU/DDU-DUV (for liquid/solid transmission measurements)
Automatic X-Y Stage (for automated measurement)
Large Specular Reflectance Attachment
Nitrogen Gas Flow Meter
Absolute Specular Reflectance Attachments (5°12°30°45°)
Sample Base Plate Integrating Sphere Set
Specifications
Hardware
| Wavelength range | SolidSpec-3700: 240-2600nm, 190-3300nm(when using Direct Deteciton Unit DDU) SolidSpec-3700DUV: 175-2600nm, 165-3300nm(when using Direct Deteciton Unit DDU-DUV) Spectral bandwidth |
|---|---|
| Spectral bandwidth | UV/VIS: 0.1-8nm (8 steps) NIR: 0.2-32nm (10 steps) |
| Resolution(*) | 0.1nm |
| Wavelength accuracy(*) | UV/VIS: ±0.2nm, NIR: ±0.8nm |
| Wavelength repeatability(*) | UV/VIS: ±0.08nm, NIR: ±0.32nm |
| Stray light(*) | Less than 0.00008% (220nm), less than 0.00005% (340nm) Less than 0.0005% (1420nm), less than 0.005%(2365nm) |
| Noise | Under 0.0002Abs (500nm, SBW 8nm), Under 0.00005Abs (1500nm, SBW 8nm) determined under conditons of RMS value at 0Abs and 1second responce. When using Direct Ditection Unit DDU/DDU-DUV, Under 0.00005Abs(500nm,SBW 2nm), Under 0.00008Abs(900nm, SBW 2nm), Under 0.00003Abs(1500nm,SBW 2nm) determined under condition of RMS value at 0Abs and 1 second responce. |
| Photometric range | -6 to 6Abs |
| Photometric system | Double beam, direct ratio measuring system |
| Dimensions | 1000W x 800D x 1200H mm, 170kg |
(* Determined with Direct Detection Unit DDU)
All-in-one Software
UVProbe software for the SolidSpec-3700/3700DUV includes functions for spectrum measurement, quantitation, kinetics and a report generator. Multiple security and audit-trail functions ensure the reliability of data.
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